Semiconductor device and method of visual inspection and...

Details Semiconductor device and method of visual inspection and... Semiconductor device and method of visual inspection and...

2011-04-05

2011-04-05

Nguyen, Thinh T (Department: 2818)

Active solid-state devices (e.g., transistors, solid-state diode

Combined with electrical contact or lead

Of specified configuration

C257S758000, C257S048000, C257SE23010, C438S011000, C438S014000

Reexamination Certificate

active

07919869

ABSTRACT:
A semiconductor device having the structure, which is adopted for the highly precise visual inspection with a lower cost, is achieved. A semiconductor device is a semiconductor device having a region for forming an electric circuit, and includes seal rings provided in an interconnect layer and surrounding the region for forming an electric circuit, and a dummy metal via provided in the interconnect layer and located outside of the seal rings. In a cross section perpendicular to an elongating direction of the seal ring, the width of the dummy metal via is smaller than the width of the seal ring.

REFERENCES:
patent: 2004/0084777 (2004-05-01), Yamanoue et al.
patent: 2005-260059 (2005-09-01), None
patent: 2005-277338 (2005-10-01), None

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