Semiconductor device and method of the semiconductor device

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Reexamination Certificate

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C365S189050, C327S536000, C327S537000

Reexamination Certificate

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06912172

ABSTRACT:
Disclosed are a semiconductor chip which is uniquely value-added, a semiconductor integrated circuit device which improves the productivity and yield of products and facilitates the production management, and a method of manufacturing of semiconductor integrated circuit devices which enables the improvement of productivity and yield of products and the rational demand-responsive production management. The semiconductor chip includes a common circuit block which is operative at a first voltage and a second voltage that is higher than the first voltage, a first circuit block which is designed to fit the first voltage and operate in unison with the common circuit block, a second circuit block which is designed to fit the second voltage and operate in unison with the common circuit block, and a voltage type setup circuit which activates one of the first and second circuit blocks, with a first identification record indicative of the operability at the first voltage or a second identification record indicative of the operability only at the second voltage being held by the chip.

REFERENCES:
patent: 5243577 (1993-09-01), Ueda et al.
patent: 5363335 (1994-11-01), Jungroth et al.
patent: 5384748 (1995-01-01), Sanemitsu
patent: 5828892 (1998-10-01), Mizuta
patent: 6226224 (2001-05-01), Banba et al.
patent: 6288599 (2001-09-01), Coddington
patent: 6434044 (2002-08-01), Gongwer et al.
patent: 6515507 (2003-02-01), Patel et al.

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