Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
Patent
1998-05-20
2000-02-15
Loke, Steven H.
Active solid-state devices (e.g., transistors, solid-state diode
Alignment marks
257734, H01L 23544, H01L 2348
Patent
active
060256524
ABSTRACT:
In a semiconductor device having a mark opening portion such as an alignment mark and an overlay mark, a BPSG film formed by patterning on this mark opening portion interposing a first conductive film is covered by a second conductive film; and the BPSG film serves as a core of a cylindrical storage node and is removed after the second conductive film is formed in a shape of sidewall by a vapor phase HF treatment process, whereby a conductive contaminant is not peeled off at the time of removing the BPSG film, wherein a drop of yield can be restricted.
REFERENCES:
patent: 5503962 (1996-04-01), Caldwell
Loke Steven H.
Mitsubishi Denki & Kabushiki Kaisha
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