Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S003000, C438S714000, C438S717000, C438S734000, C438S736000, C438S950000, C430S005000

Reexamination Certificate

active

07550392

ABSTRACT:
A semiconductor device manufacturing method, includes a step of forming a first alumina film (underlying insulating film)37on a semiconductor substrate20, a step of forming a first conductive film41, a ferroelectric film42, and a second conductive film43in sequence on the first alumina film37, a step of forming a mask material film45on the second conductive film43, a step of shaping the mask material film45into an auxiliary mask45a, a step of shaping the second conductive film43into an upper electrode43aby an etching using the auxiliary mask45aand a first resist pattern46as a mask, a step of shaping the ferroelectric film42into a capacitor dielectric film42aby patterning, and a step of shaping the first conductive film41into a lower electrode41aby patterning, whereby a capacitor Q is constructed by the lower electrode41, the capacitor dielectric film42a, and the upper electrode43a.

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