Semiconductor device manufacturing: process – Making passive device – Trench capacitor
Reexamination Certificate
2004-05-17
2008-09-09
Toledo, Fernando L. (Department: 2823)
Semiconductor device manufacturing: process
Making passive device
Trench capacitor
C257S289000, C257S411000, C257S412000, C257SE27060, C257SE29150, C257SE29242
Reexamination Certificate
active
07422953
ABSTRACT:
There is provided a method of manufacturing a semiconductor device, including forming a structure including a first layer containing Si and a metal oxide layer in contact with the first layer, the metal oxide layer having a dielectric constant higher than that of silicon oxide, and heating the structure in an atmosphere containing He and/or Ne.
REFERENCES:
patent: 3852120 (1974-12-01), Johnson et al.
patent: 4317686 (1982-03-01), Anand et al.
patent: 4837172 (1989-06-01), Mizuno et al.
patent: 5998838 (1999-12-01), Tanabe et al.
patent: 6013553 (2000-01-01), Wallace et al.
patent: 6120597 (2000-09-01), Levy et al.
patent: 6208030 (2001-03-01), Tsui et al.
patent: 6465335 (2002-10-01), Kunikiyo
patent: 6486080 (2002-11-01), Chooi et al.
patent: 6552403 (2003-04-01), Lucovsky
patent: 6613658 (2003-09-01), Koyama et al.
patent: 6635517 (2003-10-01), Chen et al.
patent: 6693324 (2004-02-01), Maegawa et al.
patent: 6713819 (2004-03-01), En et al.
patent: 2005/0054182 (2005-03-01), Wang
patent: 3-46226 (1991-02-01), None
patent: 10-209403 (1998-08-01), None
patent: 11-168212 (1999-06-01), None
patent: 2000-269483 (2000-09-01), None
patent: 2001-189312 (2001-07-01), None
patent: 2001-313292 (2001-11-01), None
patent: 2002-50624 (2002-02-01), None
J. P. Maria et al., High Temperature Stability in Lanthanum and Zirconia-based Gate Dielectrics,Journal of Applied Physics, vol. 90, No. 7, Oct. 1, 2001, pp. 3476-3482.
Heiji Watanabe, Interface Engineering of a ZrO2/SiO2/Si Layered Structure by in situ Reoxidation and its Oxygen-pressure-dependent Thermal Stability,Applied Physics Letters, vol. 78, No. 24, Jun. 11, 2001, pp. 3803-3805.
T. S. Jeon et al., Thermal Stability of Ultrathin ZrO2Films Prepared by Chemical Vapor Deposition on Si(100),Applied Physics Letters, vol. 78, No. 3, Jan. 15, 2001, pp. 368-370.
V. V. Afanas'ev et al., Pressure Dependence of Si/SiO2Degradation Supresion by Helium,Journal of Applied Physics, vol. 87, No. 10, pp. 7338-7341.
Kurihara Kazuaki
Muraoka Kouichi
Jefferson Quovaunda
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Toledo Fernando L.
LandOfFree
Semiconductor device and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of manufacturing the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3991093