Semiconductor device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including high voltage or high power devices isolated from...

Reexamination Certificate

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C257S501000, C257SE27064

Reexamination Certificate

active

11117689

ABSTRACT:
A semiconductor device includes a first n-type source/drain region48aand a second p-type source/drain region48bformed on a semiconductor substrate20away from side surfaces of first and second gate electrodes39a,39bat a first interval W4respectively, a second n-type source/drain region48cand a first p-type source/drain region48dformed on the semiconductor substrate20away from side surfaces of third and fourth gate electrodes39c,39dat a second interval W3, which is wider than the first interval W4, respectively, and third and fourth insulating sidewalls43c,43dextended onto source/drain extensions42c,42don both sides of third and fourth gate electrodes39c,39dfrom edges of upper surfaces of the third and fourth gate electrodes39c,39drespectively.

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patent: 2002-26139 (2002-01-01), None

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