Semiconductor device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Bipolar transistor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S588000, C257S592000

Reexamination Certificate

active

10813446

ABSTRACT:
An aspect of a semiconductor device includes: a collector layer of first conductive type formed on a semiconductor substrate; a graft base layer of second conductive type formed in a surface region of the collector layer; a first base leading-out region of second conductive type formed on the graft base layer; a second base leading-out region of second conductive type formed on an upper surface and a side surface of the first base leading-out region; a base layer of second conductive type formed on the collector layer; an emitter layer of first conductive type formed in a surface region of the base layer; and an emitter leading-out region formed on the emitter layer.

REFERENCES:
patent: 6043552 (2000-03-01), Miwa
patent: 60-235464 (1985-11-01), None
patent: 61-042138 (1986-02-01), None
patent: 63-193562 (1988-08-01), None
patent: 03-022440 (1991-01-01), None
patent: 4-294543 (1992-10-01), None
patent: 11-233523 (1999-08-01), None
patent: 2001-068479 (2001-03-01), None
patent: 2002-270819 (2002-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3819016

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.