Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2006-10-17
2006-10-17
Parker, Kenneth (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S072000, C257S020000, C257S258000, C257SE51005, C438S048000, C438S128000, C438S149000, C438S151000, C438S157000, C438S283000, C349S038000, C349S039000, C349S151000
Reexamination Certificate
active
07122830
ABSTRACT:
The present invention provides a semiconductor device wherein the area of a peripheral circuit region with respect to a pixel region is reduced, and provides a manufacturing method of the semiconductor device. A semiconductor device according to the present invention is characterized by having a pixel region1,peripheral circuit regions2ato2carranged in at least a part of the periphery of the pixel region, and a wiring formed in the peripheral circuit region, and by having a wiring multilayered with two or more layers. At least one layer of the multilyered wiring is formed from a low resistance material. Transistors are formed in the peripheral circuit region, and the multilayer wiring with two or more layers is formed on the upper side of the transistors.
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Fukushima Yasumori
Ishikawa Akira
Costellia Jeffrey L.
Nixon & Peabody LLP
Parker Kenneth
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