Semiconductor device and method of manufacture thereof

Semiconductor device manufacturing: process – Chemical etching

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S658000, C438S688000, C257S758000, C257S773000, C257S774000

Reexamination Certificate

active

06989330

ABSTRACT:
In order to form an aluminum system wiring that does not peel off on an insulating film containing fluorine and to improve the reliability thereof, a semiconductor device according to the present invention includes an insulating film (14) containing fluorine formed on a substrate (11), a titanium aluminum alloy film (17a) formed on the insulating film (14) containing fluorine, and a metallic film (17b) comprising aluminum or an aluminum alloy formed on the titanium aluminum alloy film (17a).

REFERENCES:
patent: 5614439 (1997-03-01), Murooka et al.
patent: 5644166 (1997-07-01), Honeycutt et al.
patent: 5700383 (1997-12-01), Feller et al.
patent: 5990011 (1999-11-01), McTeer
patent: 6150272 (2000-11-01), Liu et al.
patent: 6281584 (2001-08-01), Ngo
patent: 2002/0109235 (2002-08-01), Leiphart
patent: 10-098102 (1998-04-01), None
patent: 11-345876 (1999-12-01), None
patent: 2000-208622 (2000-07-01), None
patent: 2000-286262 (2000-10-01), None
patent: 2001-144180 (2001-07-01), None
patent: 2001-210647 (2001-08-01), None
patent: 2001-284448 (2001-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method of manufacture thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method of manufacture thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of manufacture thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3577327

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.