Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2005-09-13
2005-09-13
Zarneke, David A. (Department: 2891)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
Reexamination Certificate
active
06943115
ABSTRACT:
A method is provided for manufacturing a semiconductor device having a multilayer wiring structure in which at least one insulating film is formed with a set of conducting portions which are electrically connected to each other to have a surface area of no less than 500 μm2and which include a wiring having a width of no more than 1.0 μm. The method includes a polishing step for flattening the conducting portions together with the insulating film by chemical mechanical polishing, a chemical cleaning step for cleaning the flattened surface of the insulating film with a cleaning liquid, and a rising step for removing the cleaning liquid using a rinsing liquid. The rinsing step is performed using water with a dissolved oxygen concentration decreased to no more than 6 ppm by weight as the rinsing liquid.
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Horiuchi Hiroshi
Miyajima Motoshu
Santo Nobuaki
Suzuki Shigeru
Takigawa Yukio
Armstrong Kratz Quintos Hanson & Brooks, LLP
Fujitsu Limited
Zarneke David A.
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