Semiconductor device and method of inspecting the same

Details Semiconductor device and method of inspecting the same Semiconductor device and method of inspecting the same

2006-04-04

2006-04-04

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S076770

Reexamination Certificate

active

07023198

ABSTRACT:
A semiconductor chip is provided with a phase comparison circuit (1), in addition to an integrated circuit implementing a normal operation. The phase comparison circuit (1) compares phases between an internal signal (A) of the integrated circuit and an external signal and outputs a monitor signal (MONSIG) expressing the result of this comparison outward from the semiconductor chip. Thus, the phase of the internal signal (A) of the integrated circuit can be directly detected.

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