Semiconductor device and method for testing semiconductor...

Details Semiconductor device and method for testing semiconductor... Semiconductor device and method for testing semiconductor...

2007-07-24

2007-07-24

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S073100

Reexamination Certificate

active

11172928

ABSTRACT:
A method for testing a semiconductor device incorporating a controller, which generates first and second complementary signals, and a memory, which operates in accordance with the first and second complementary signals. The method includes selectively switching the first and second complementary signals to an intermediate potential signal having an intermediate potential of the complementary signals. The method further includes conducting an operational test on the second device with the first and second complementary signals and the intermediate potential signal. This method enables detection of a defective connection between the devices.

REFERENCES:
patent: 4339673 (1982-07-01), Perry
patent: 6057716 (2000-05-01), Dinteman et al.
patent: 6356096 (2002-03-01), Takagi et al.
patent: 6756803 (2004-06-01), Miura et al.
patent: 2005-057677 (2005-03-01), None

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