Semiconductor device and method for producing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

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Details

C257S336000, C257S369000, C257S408000

Reexamination Certificate

active

07456448

ABSTRACT:
A semiconductor device, including a first MIS-type transistor formed in a first region of a semiconductor region, the first region being of a first conductivity type, the first MIS-type transistor including: a first gate insulating film formed on the first region; a first gate electrode formed on the first gate insulating film; a first extension diffusion layer of a second conductivity type formed in a region of the first region under and beside the first gate electrode; and a first fluorine diffusion layer formed in a first channel region of the first conductivity type sandwiched between portions of the first extension diffusion layer, wherein portions of the first fluorine diffusion layer extend from the first extension diffusion layer and overlap together in a region directly under the first gate electrode.

REFERENCES:
patent: 7053450 (2006-05-01), Kotani
patent: 7078285 (2006-07-01), Suenaga
patent: 7176530 (2007-02-01), Bulucea et al.
patent: 2004/0188767 (2004-09-01), Weber et al.
patent: 2001-156291 (2001-06-01), None
patent: 3523151 (2004-02-01), None

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