Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2007-07-24
2007-07-24
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
C438S026000, C257S099000, C257S777000, C257SE33056, C257SE33057, C257SE23023
Reexamination Certificate
active
10819873
ABSTRACT:
A method for producing a semiconductor device of the present invention includes forming a surface electrode on a semiconductor element, forming a solder layer by plating on one principal surface of the surface electrode, mounting the semiconductor element on the sub-mount so that the solder layer contacts a principal surface of the sub-mount, and bonding the sub-mount and the semiconductor element to each other via the solder layer.
REFERENCES:
patent: 5197654 (1993-03-01), Katz et al.
patent: 5234153 (1993-08-01), Bacon et al.
patent: 5794839 (1998-08-01), Kimura et al.
patent: 6692629 (2004-02-01), Chen et al.
patent: 6721342 (2004-04-01), Yabuki et al.
patent: 6787903 (2004-09-01), Yang
patent: 6878608 (2005-04-01), Brofman et al.
patent: 2003/0067950 (2003-04-01), Hanaoka
patent: 2 062 346 (1981-05-01), None
patent: 56-27988 (1981-03-01), None
patent: 63-233591 (1988-09-01), None
patent: 6-69608 (1994-03-01), None
patent: 8-181392 (1996-07-01), None
patent: 9-172224 (1997-06-01), None
patent: 11-204884 (1999-07-01), None
patent: 11-214791 (1999-08-01), None
Kidoguchi Isao
Miyamoto Takashi
Ueda Tetsuo
Yamane Keiji
Hamre Schumann Mueller & Larson P.C.
Mandala Jr. Victor A.
Pert Evan
LandOfFree
Semiconductor device and method for producing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and method for producing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method for producing the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3818064