Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
Reexamination Certificate
2006-09-12
2006-09-12
Baumeister, Bradley (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Gate arrays
With particular signal path connections
C257S773000
Reexamination Certificate
active
07105873
ABSTRACT:
In a masking pattern (a) for patterning word and data lines, length is changed between adjacent word lines so as to be shifted from each other at their tips, and furthermore, the tip of each word line is cut obliquely.It is thus possible to prevent the resist pattern from separation and contact of adjacent patterns. Consequently, it is also possible to prevent break failures of patterned lines and short failures between those patterned lines.
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Kimura Katsutaka
Sakata Takeshi
Sekiguchi Tomonori
Tanaka Toshihiko
Yamanaka Toshiaki
Baumeister Bradley
Farahani Dana
Hitachi , Ltd.
Mattingly, Stanger, Malur & Brundidge, P.C
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