Semiconductor device and method for manufacturing the same

Metal working – Method of mechanical manufacture – Assembling or joining

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29578, 29580, 29590, 148175, 357 23, 357 67, 357 71, 427 84, 427 88, 427 91, 4272554, H01L 2186, H01L 2188

Patent

active

044257007

ABSTRACT:
The method of manufacture of a semiconductor device having wirings or electrodes of silicide formed by: exposing parts of a single-crystal silicon layer formed on an insulating substrate, forming a film of metal over the exposed parts, and annealing so that a silicide is formed of the silicon and metal throughout the entire thickness of the silicon layer. The single-crystal silicon layer may be formed on a sapphire or spinel substrate having a film of silicon dioxide, sapphire or spinel, epitaxially grown on a silicon substrate.

REFERENCES:
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patent: 3753774 (1973-08-01), Veloric
patent: 3777364 (1973-12-01), Schinella et al.
patent: 4080719 (1978-03-01), Wilting
patent: 4102733 (1978-07-01), De La Moneda et al.
patent: 4276688 (1981-07-01), Hsu
patent: 4336550 (1982-06-01), Medwin
Kircher et al., "Interconnection Method for Integrated Circuits", I.B.M. Tech. Discl. Bull., vol. 13, No. 2, Jul. 1970, p. 436.

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