Semiconductor device and method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

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C257S194000, C257SE29246, C257SE21403

Reexamination Certificate

active

08030686

ABSTRACT:
A semiconductor device having a source electrode and a drain electrode formed over a semiconductor substrate, a gate electrode formed over the semiconductor substrate and disposed between the source electrode and the drain electrode, a protection film made of an insulating material and formed between the source electrode and the gate electrode and between the drain electrode and the gate electrode, and a gate side opening formed at least in one of a portion of the protection film between the source electrode and the gate electrode and a portion of the protection film between the drain electrode and the gate electrode and disposed away from all of the gate electrode, the source electrode and the drain electrode.

REFERENCES:
patent: 6404004 (2002-06-01), Arimochi et al.
patent: 6924218 (2005-08-01), Marsh et al.
patent: 2002-359256 (2002-12-01), None

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