Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having a perfecting coating
Reexamination Certificate
2008-04-22
2008-04-22
Zarneke, David A. (Department: 2891)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
Having a perfecting coating
C438S462000, C257SE21599
Reexamination Certificate
active
11614748
ABSTRACT:
Embodiments relate to a semiconductor device and a method for manufacturing a semiconductor device that may be capable of improving a step coverage of main chip and scribe lane regions during a formation of an interlayer dielectric are provided. In embodiments, the semiconductor device may include metal layers formed on a substrate including a main chip region and a scribe lane region, respectively, an interlayer dielectric formed on the substrate including the metal layers, a step coverage improving layer formed on an interlayer dielectric of the scribe lane region, a via hole inside the step coverage improving layer and the interlayer dielectric, and a via plug formed by filling the via hole with a metal.
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Dongbu Hitek Co., Ltd.
Sherr & Nourse, PLLC
Zarneke David A.
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