Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device
Reexamination Certificate
2006-04-25
2006-04-25
Loke, Steven (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Charge transfer device
C257S250000, C257S332000, C257S241000, C257S314000, C257S315000
Reexamination Certificate
active
07034346
ABSTRACT:
A semiconductor device according to an embodiment of the present invention has a gate electrode which is formed on a semiconductor substrate via a gate insulating film, and which has a slit portion; side wall films formed at both side faces of the gate electrode and at side walls of the slit portion, and which fill an interior of the slit portion and cover the gate insulating film directly beneath the slit portion; and an interlayer insulating film formed to cover the gate electrode and the side wall films.
REFERENCES:
patent: 5155052 (1992-10-01), Davies
patent: 5703383 (1997-12-01), Nakayama
patent: 5936291 (1999-08-01), Makita et al.
patent: 6040598 (2000-03-01), Nakayama et al.
patent: 6087697 (2000-07-01), Patel
patent: 6157058 (2000-12-01), Ogura
patent: 6232186 (2001-05-01), Patel
patent: 6259142 (2001-07-01), Dawson et al.
patent: 7-221296 (1995-08-01), None
patent: 8-298321 (1996-11-01), None
patent: 2000-156383 (2000-06-01), None
patent: 2002-184784 (2002-06-01), None
S. Wolf, “SiliconProcessing for the VLSI Era, vol. 2: Process Integration,” Lattice Press, Sunset Beach, CA (1990), pp. 143-147,273.
Aida Satoshi
Izumisawa Masaru
Kouzuki Shigeo
Nakayama Kazuya
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