Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2005-11-29
2005-11-29
Kebede, Brook (Department: 2823)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C438S113000
Reexamination Certificate
active
06969623
ABSTRACT:
A semiconductor device and a method for manufacturing the semiconductor device mountable with high density, which includes a simplified process but is capable of reducing a defect rate. A plurality of identical memory chips are formed on a semiconductor wafer, and a go
o-go test is conducted on all the memory chips. The semiconductor wafer is cut and divided into pieces that each consists of one, or two, or four good memory chips, and they are mounted on a substrate to form a memory module.
REFERENCES:
patent: 5497381 (1996-03-01), O'Donoghue et al.
patent: 5504369 (1996-04-01), Dasse et al.
patent: 5786237 (1998-07-01), Cockerill et al.
Ikeda Kouichi
Ikeda Takeshi
Dellett & Walters
Kebede Brook
Niigata Seimitsu Co., Ltd.
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