Semiconductor device and method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With peripheral feature due to separation of smaller...

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H01L 23544

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active

059905409

ABSTRACT:
A mask pattern applied to a peripheral portion of a wafer has an open/close ratio substantially the same as that in a central portion thereof and prepared according to a looser design rule than that for forming the central portion. The looser design rule has a high latitude for out-of-focus exposure and provides high resistance to pattern removal. Since the open/close ratios in the central portion and the peripheral portion of the wafer are substantially the same, variance in process accuracy due to a micro-loading effect can be prevented.

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