Semiconductor device manufacturing: process – Semiconductor substrate dicing
Reexamination Certificate
2007-07-31
2007-07-31
Geyer, Scott B. (Department: 2812)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
C438S113000, C257SE21238
Reexamination Certificate
active
11220921
ABSTRACT:
A semiconductor device according to the present invention includes a semiconductor substrate, which comprises a first surface on which an electrode pad is formed, and a second surface arranged at an opposite side of the first surface; an external terminal formed on the first surface of the semiconductor substrate and is electrically connected to the electrode pad; and a sealing resin which seals the first surface so that a surface of the external terminal is exposed. An outer edge of the second surface has a chamfered portion, a surface of which is inclined by substantially 45 degrees from the second surface.
REFERENCES:
patent: 5128282 (1992-07-01), Ormond et al.
patent: 6276995 (2001-08-01), Matsuta et al.
patent: 6455920 (2002-09-01), Fukasawa et al.
patent: 6482730 (2002-11-01), Masumoto et al.
patent: 6790709 (2004-09-01), Dias et al.
patent: 2003-060120 (2003-02-01), None
Geyer Scott B.
Oki Electric Industry Co. Ltd.
Rabin & Berdo PC
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