Semiconductor device and method for fabricating the same

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S745000

Reexamination Certificate

active

10970026

ABSTRACT:
A semiconductor device has a first nitride semiconductor layer, a second nitride semiconductor layer formed on the first nitride semiconductor layer and having such a composition as to generate a 2-dimensional electron gas layer in the upper portion of the first nitride semiconductor layer, and an electrode having an ohmic property and formed selectively on the second nitride semiconductor layer. The second nitride semiconductor layer includes a contact area having at least one inclined portion with a bottom or wall surface thereof being inclined toward the upper surface of the first nitride semiconductor layer and defining a depressed cross-sectional configuration. The electrode is formed on the contact area.

REFERENCES:
patent: 4714948 (1987-12-01), Mimura et al.
patent: 4916498 (1990-04-01), Berenz
patent: 4996163 (1991-02-01), Sasaki
patent: 5406094 (1995-04-01), Arimoto et al.
patent: 5550393 (1996-08-01), Nishimura
patent: 5606184 (1997-02-01), Abrokwah et al.
patent: 5689125 (1997-11-01), Vaccaro et al.
patent: 6853016 (2005-02-01), Kobayashi
patent: 2003-59946 (2003-02-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method for fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method for fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method for fabricating the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3758245

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.