Semiconductor device and method and apparatus for testing the sa

Details Semiconductor device and method and apparatus for testing the sa Semiconductor device and method and apparatus for testing the sa

1990-07-31

1992-07-21

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 226, G01H 3128

Patent

active

051326140

ABSTRACT:
A semiconductor device in which a semiconductor chip has a plurality of output terminals which are connected to a common node outside of the chip itself and are arranged into at least one group. A selection circuit disposed within the semiconductor selects one output terminal from among the output terminals in the group and allows data to be supplied only to the selected terminal. After testing, the output terminals are disconnected from one another to allow the chip to function properly.

REFERENCES:
patent: 3838296 (1974-09-01), McLeod
patent: 4446390 (1984-05-01), Alaspa
patent: 4490673 (1984-12-01), Blum et al.
patent: 4746856 (1988-05-01), Allred, Jr. et al.
patent: 5019772 (1991-05-01), Dreibelris et al.

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