Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2007-12-03
2011-11-29
Tran, Long (Department: 2829)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S066000, C257S069000, C257S072000, C257S350000, C257SE27111, C257SE29278
Reexamination Certificate
active
08067772
ABSTRACT:
An object is to provide a semiconductor device with improved reliability and for which a defect due to an end portion of a semiconductor layer provided in an island-shape is prevented, and a manufacturing method thereof. A structure includes an island-shaped semiconductor layer provided over a substrate, an insulating layer provided over a top surface and a side surface of the island-shaped semiconductor layer, and a gate electrode provided over the island-shaped semiconductor layer with the insulating layer interposed therebetween. In the insulating layer provided to be in contact with the island-shaped semiconductor layer, a region that is in contact with the side surface of the island-shaped semiconductor layer is made to have a lower dielectric constant than a region over the top surface of the island-shaped semiconductor layer.
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Office Action re Chinese application No. CN 200710196482.2, dated Mar. 9, 2011 (with English translation).
Ikeda Kazuko
Sasagawa Shinya
Suzawa Hideomi
Yamazaki Shunpei
Husch & Blackwell LLP
Semiconductor Energy Laboratory Co,. Ltd.
Tran Long
LandOfFree
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