Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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C257S752000, C257S763000, C257S773000

Reexamination Certificate

active

07414314

ABSTRACT:
A semiconductor device has a semiconductor substrate, a first insulating film formed on a surface of the semiconductor substrate, a first recess formed in the first insulating film, a first barrier film formed on an inner surface of the first insulating film except a top peripheral region of the first trench, a first conductive film formed in the first trench, and a covering film formed on an upper surface and a top peripheral region of the first conductive film and an upper surface of the first barrier film. The first conductive film includes copper.

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patent: 5358621 (1994-10-01), Oyama
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patent: 5817573 (1998-10-01), Rhodes et al.
patent: 5907787 (1999-05-01), Sato
patent: 5960314 (1999-09-01), Rhodes et al.
patent: 6521531 (2003-02-01), Yoshizawa
patent: 2005/0009339 (2005-01-01), Park
patent: 2002-329780 (2002-11-01), None

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