Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Reexamination Certificate

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Details

C257S291000, C257S292000, C257S462000, C257SE27133

Reexamination Certificate

active

07385270

ABSTRACT:
A solid-state imaging device achieving a global shutter of images and its manufacturing method are disclosed. According to one aspect of the present invention, it is provided a solid-state imaging device comprising an optical signal storage region provided in a semiconductor substrate, a signal detecting region provided in the semiconductor substrate apart from the optical signal storage region, a transistor electrically connecting the optical signal storage region with the signal detecting region, a wiring connected with the signal detecting region, and a light shielding film provided in close proximity to the signal detecting region and over the signal detecting region.

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patent: 6448596 (2002-09-01), Kawajiri et al.
patent: 6483163 (2002-11-01), Isogai et al.
patent: 6512547 (2003-01-01), Miida
patent: 6642087 (2003-11-01), Nozaki et al.
patent: 6677627 (2004-01-01), Miida
patent: 6812539 (2004-11-01), Rhodes
patent: 7126102 (2006-10-01), Inoue et al.
patent: 7157758 (2007-01-01), Mizuguchi
patent: 7242043 (2007-07-01), Ohkawa
patent: 2001-150849 (2000-05-01), None

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