Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Field effect device in non-single crystal – or...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257 67, 257347, H01L 2976, H01L 31036, H01L 31112, H01L 2701

Patent

active

055503900

ABSTRACT:
A semiconductor device includes a gate electrode, and a semiconductor layer formed on the main surface of the gate electrode with a gate oxide film therebetween. The semiconductor layer has a channel region opposing the main surface of gate electrode and source/drain regions having the channel region therebetween, and is formed so that the bent angle in the vicinity of the boundaries of the channel region and the source/drain regions is beyond 90.degree.. Thus, the semiconductor layer formed in a thin film transistor has no orthogonal bent, and, therefore the concentration of electric fields is suppressed, improving the performance of the thin film transistor.

REFERENCES:
"256 kbit CMOS EPROM HN27C256", Hideaki Takahashi et al., 8297 Hitachi Review, vol. 34, No. 6, Dec., 1985, pp. 295-298.
International Electron Devices Meeting, 1990, San Francisco, California, Dec. 9-12, 1990 pp. 18.3.1-18.3.4.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and manufacturing method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1057787

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.