Patent
1989-02-09
1992-07-21
Jackson, Jr., Jerome
357 231, 357 233, H01L 2910, H01L 2978
Patent
active
051327589
ABSTRACT:
In a MOSFET of an LDD structure, a side wall is made conductive and connected to a gate through a resistance thereby to cause hot carriers taken into the side wall to be discharged to a gate through the resistance, whereby a channel resistance is prevented from being increased by an effect of carriers accumulated in the side wall. As a result, a reliable MOSFET with a short channel can be provided which is not degraded even if it is used for a long time.
REFERENCES:
patent: 4502202 (1985-03-01), Malhi
Minami Masataka
Nagano Takahiro
Wakui Youkou
Dang Hung Xuan
Hitachi , Ltd.
Jackson, Jr. Jerome
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