Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – On insulating substrate or layer
Reexamination Certificate
2006-06-20
2006-06-20
Owens, Douglas W. (Department: 2811)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
On insulating substrate or layer
C438S186000, C438S197000, C438S294000
Reexamination Certificate
active
07064041
ABSTRACT:
To provide a semiconductor device that permits free setting of characteristics of individual semiconductor elements which are mixedly mounted and have different characteristics, and is free of steps between formed semiconductor elements, in a manufacturing method for the semiconductor device, an n-type silicon layer is deposited on a p-type silicon substrate by epitaxial growth, and then an SOI layer is deposited thereon through the intermediary of a BOX layer. A junction transistor using a part of the n-type silicon layer as a channel region and a MOS transistor using the SOI layer are produced.
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patent: 01-183145 (1989-07-01), None
patent: 02-105565 (1990-04-01), None
patent: 06-334030 (1994-12-01), None
Oki Electric Industry Co. Ltd.
Owens Douglas W.
Rabin & Berdo PC
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