Semiconductor device and fabrication method for the same

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having substrate registration feature

Reexamination Certificate

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C438S151000

Reexamination Certificate

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10963817

ABSTRACT:
In a semiconductor device including a monocrystalline thin film transistor16athat has been formed on a monocrystalline Si wafer100and then is transferred to a insulating substrate2, LOCOS oxidization is performed with respect to the element-isolation region of the monocrystalline Si wafer100so as to create a field oxide film (SiO2film)104, and a marker107is formed on the field oxide film104. With this structure, alignment of components may be performed based on a gate electrode106upon or after the transfer step.

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