Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2007-09-25
2007-09-25
Jackson, Jerome (Department: 2815)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S435000, C257S500000, C257S501000, C257SE21549, C257SE21550
Reexamination Certificate
active
11024742
ABSTRACT:
A semiconductor device including a semiconductor substrate, a device isolation region formed by filling a trench in the semiconductor substrate with dielectric material and defining device regions in the semiconductor substrate. The trench has a rounded upper edge, and a dummy thin layer formed on the rounded upper edge.
REFERENCES:
patent: 5683908 (1997-11-01), Miyashita et al.
patent: 6627512 (2003-09-01), Iwamatsu et al.
patent: 6858515 (2005-02-01), Ishitsuka et al.
patent: 6900090 (2005-05-01), Park
patent: 2003/0181022 (2003-09-01), Mehrad et al.
Budd Paul
Dongbu Electronics Co. Ltd.
Jackson Jerome
Lowe Hauptman & Berner LLP
LandOfFree
Semiconductor device and fabricating method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and fabricating method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and fabricating method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3771813