Semiconductor device and entry into test mode without use of...

Details Semiconductor device and entry into test mode without use of... Semiconductor device and entry into test mode without use of...

2008-05-13

2008-05-13

Phung, Anh (Department: 2824)

Static information storage and retrieval

Powering

C365S189070, C365S201000

Reexamination Certificate

active

07372760

ABSTRACT:
A semiconductor device includes a first power supply terminal, a second power supply terminal, a comparison circuit coupled to the first power supply terminal and the second power supply terminal to produce at an output node thereof a signal responsive to a difference between a potential of the first power supply terminal and a potential of the second power supply terminal, and a core circuit coupled to the output node of the comparison circuit to perform a test operation in response to the signal.

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patent: 6373744 (2002-04-01), Mano
patent: 6550038 (2003-04-01), Shirata
patent: 6777707 (2004-08-01), Akiyama et al.
patent: 6944812 (2005-09-01), Chevallier
patent: 06-309475 (1994-11-01), None
patent: 09-105771 (1997-04-01), None
patent: 2001-053232 (2001-02-01), None

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