Miscellaneous active electrical nonlinear devices – circuits – and – External effect – Temperature
Reexamination Certificate
2008-05-30
2010-11-23
Luu, An T (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
External effect
Temperature
C327S513000, C327S170000, C327S175000
Reexamination Certificate
active
07839200
ABSTRACT:
Semiconductor device and data outputting method of the same includes an on die thermal sensor (ODTS) configured to output temperature information by detecting an internal temperature of the semiconductor device and an output driver configured to control a slew rate depending on the temperature information and output data.
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Notice of Allowance issued from Korean Intellectual Property Office on Mar. 9, 2009 with an English Translation.
Im Jae-Hyuk
Park Kee-Teok
Hynix / Semiconductor Inc.
IP & T Group LLP
Luu An T
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