Semiconductor device and data outputting method of the same

Miscellaneous active electrical nonlinear devices – circuits – and – External effect – Temperature

Reexamination Certificate

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Details

C327S513000, C327S170000, C327S175000

Reexamination Certificate

active

07839200

ABSTRACT:
Semiconductor device and data outputting method of the same includes an on die thermal sensor (ODTS) configured to output temperature information by detecting an internal temperature of the semiconductor device and an output driver configured to control a slew rate depending on the temperature information and output data.

REFERENCES:
patent: 5291071 (1994-03-01), Allen et al.
patent: 6366153 (2002-04-01), Arslain et al.
patent: 6646483 (2003-11-01), Shin
patent: 6894547 (2005-05-01), Takahashi
patent: 2007/0252638 (2007-11-01), Aquil et al.
patent: 1020000055937 (2000-09-01), None
patent: 1020050088862 (2005-09-01), None
patent: 1020060122193 (2006-11-01), None
patent: 100668515 (2007-01-01), None
Notice of Allowance issued from Korean Intellectual Property Office on Mar. 9, 2009 with an English Translation.

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