Semiconductor device and burn-in method thereof

Details Semiconductor device and burn-in method thereof Semiconductor device and burn-in method thereof

1996-05-22

1997-05-06

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G01R 3102

Patent

active

056274777

ABSTRACT:
The semiconductor device includes a circuit, such as, an ECL circuit for comparing input signals with a reference potential determined as a circuit threshold value and outputting an output signal according to the comparison result. The semiconductor device further includes a switching circuit for switching the reference potential level between ordinary operation and burn-in operation of the ECL circuit. The time required for the burn-in operation can be reduced markedly.

REFERENCES:
patent: 4542303 (1985-09-01), Jarrett et al.
patent: 5155386 (1992-10-01), Abdi
patent: 5227865 (1993-07-01), Moriizumi et al.
Research Disclosure, "Dynamic Burn-In of VLSI Products by Power Supply Cycling", No. 339, p. 527, Jul. 1992.
Patent Abstracts of Japan vol. 14, No. 144, Mar. 2, 1990.
Patent Abstracts of Japan vol. 18, No. 211, Apr. 14, 1994.

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