Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of...
Reexamination Certificate
2005-06-14
2005-06-14
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
C257S592000
Reexamination Certificate
active
06905934
ABSTRACT:
The invention provides a bipolar transistor with improved performance. An insulation film comprising a silicon oxide film is formed by means of oxidation treatment on the side surface of an emitter aperture, and then an epitaxial layer comprised of SiGe is grown selectively in an aperture formed by removing a silicon nitride film so as to form under cut.
REFERENCES:
patent: 4892837 (1990-01-01), Kudo
patent: 5204276 (1993-04-01), Nakajima et al.
patent: 6-112215 (1994-04-01), None
Hashimoto Takashi
Kondo Masao
Mikami Kouji
Oue Eiji
Udo Tsutomu
Hitachi , Ltd.
Hitachi ULSI Systems Co. Ltd.
Mattingly ,Stanger ,Malur & Brundidge, P.C.
Vu David
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