Semiconductor device

Static information storage and retrieval – Floating gate

Reexamination Certificate

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Details

C365S185180, C365S185240, C365S185260, C365S185270, C257S326000, C257S296000, C257S316000

Reexamination Certificate

active

07388777

ABSTRACT:
A plurality of nonvolatile memory cells that constitute a nonvolatile memory are disposed in array form. Selection MIS•FETs for memory cell selection are electrically connected every bits. Each of the nonvolatile memory cells has a MIS•FET for writing data, a MIS•FET for reading data, and a capacitance section. Gate electrodes of the MIS•FETs and a capacitance electrode of the capacitance section are constituted of part of the same floating gate electrode. A control gate electrode of the nonvolatile memory cell is formed of part of an n well to which the capacitance electrode is opposite.

REFERENCES:
patent: 5477068 (1995-12-01), Ozawa
patent: 5917751 (1999-06-01), Wakita
patent: 2001-185633 (2001-07-01), None
patent: 2001-257324 (2001-09-01), None

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