Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-08-23
2011-08-23
Valone, Thomas (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S076520
Reexamination Certificate
active
08004306
ABSTRACT:
A semiconductor device according to an embodiment of the present invention includes: an oscillating circuit including a plurality of logic circuits connected in series; and an error detecting circuit receiving output signals of at least two of the plurality of logic circuits, and suspending an operation of the oscillating circuit to notify other blocks of the oscillating circuit that an error occurs in the oscillating circuit if a phase difference between the output signals is not within a predetermined phase difference range.
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Machine Translation of JP2004-221697 of record, Jan. 9, 2008, provided by JPO, dictionary updated Dec. 14, 2007.
Matakias, S. et al., “A circuit for concurrent detection of soft and timing errors in digital CMOS ICs”, Jour. of Electronic Testing, Kluwer Academic Pub., 20, 2004, p. 523-531.
Norbert Seifert, et al., “Frequency Dependent of Soft Error Rates for Sub-micron CMOS Technologies”, International Electron Device Meeting Technical Digest pp. 323-326.
Pitsini Mongkolkachit et al., “Design Technique for Mitigation of Alpha-Particle-Induce Single-Event Transients in Combination Logic”, IEEE Transaction on Device and Materials Reliability, vol. 3, No. 3, pp. 89-92.
Furuta Hiroshi
Takahashi Hiroyuki
Renesas Electronics Corporation
Valone Thomas
Young & Thompson
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