Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure – With means to reduce minority carrier lifetime
Reexamination Certificate
2011-03-08
2011-03-08
Lee, Eugene (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Bipolar transistor structure
With means to reduce minority carrier lifetime
C257S586000, C257SE29027, C257SE29037, C257SE29197
Reexamination Certificate
active
07902634
ABSTRACT:
An n+-emitter layer arranged under an emitter electrode is formed of convex portions arranged at predetermined intervals and a main body coupled to the convex portions. A convex portion region is in contact with the emitter electrode, and a p+-layer doped more heavily than a p-base layer is arranged at least below the emitter layer. In a power transistor of a lateral structure, a latch-up immunity of a parasitic thyristor can be improved, and a turn-off time can be reduced.
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Gumedzoe Peniel M
Lee Eugene
Mitsubishi Electric Corporation
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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