Semiconductor device

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit

Reexamination Certificate

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Details

C327S565000

Reexamination Certificate

active

07973590

ABSTRACT:
A semiconductor device includes a first transmission line and a second transmission line disposed at different layers; a contact fuse coupled with the first transmission line and the second transmission line; a power driver configured to apply an electric stress to the contact fuse; and a fuse state output unit configured to output a fuse state signal having a logic level corresponding to an electric connection state of the contact fuse.

REFERENCES:
patent: 7413980 (2008-08-01), Guo et al.
patent: 7642176 (2010-01-01), Cheng et al.
patent: 2005/0285222 (2005-12-01), Thei et al.
patent: 2006-253237 (2006-09-01), None
patent: 1020080046510 (2008-05-01), None
J.J. Wang et al., “Total Dose and SEE of Metal-To-Metal Antifuse FPGA”, Military and Aerospace Applications of Programmable Devices and Technologies Conference, 1999.
Notice of Preliminary Rejection issued from Korean Intellectual Property Office on Apr. 20, 2011.

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