Semiconductor device

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357 59, H01L 2348

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active

050937111

ABSTRACT:
A semiconductor device used as an electrically programmable read-only memory. The resistance of the device is irreversibly varied from a high value to a low value by applying an electric field. The device is composed of a silicon semiconductor substrate of a first conductivity type, a diffused layer of a second conductivity type opposite to the first conductivity type, an interlayer insulating film formed on the diffused layer, an amorphous silicon layer containing impurity of the first conductivity type, and a metal film forming conductive interconnections. The diffused layer acts as a lower electrode. The metal film serves as an upper electrode. The amorphous silicon layer and the metal film are stacked on the diffused layer.

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Yosi Shacham-Diamon et al., A Novel Ion-Implanted Amorphous Silicon Programmable Element, IEDM 87, pp. 194-197.
Esmat Handy et al., Dielectric Based Antifuse for Logic and Memory ICs. IEDM 88, pp. 786-789.

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