Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – Having specific type of active device
Reexamination Certificate
2011-03-22
2011-03-22
Maldonado, Julio J (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Gate arrays
Having specific type of active device
C257S365000, C257S371000, C257S392000, C257S407000, C257SE29134, C257SE29135, C257SE29136, C257SE21638
Reexamination Certificate
active
07910957
ABSTRACT:
A semiconductor device has a first and a second active regions of a first conductivity type disposed on a semiconductor substrate, a third and a fourth active regions of a second conductivity type disposed on the semiconductor substrate, the second and the fourth active regions having sizes larger than those of the first and the third active regions respectively, a first electroconductive pattern disposed adjacent to the first active region and having a first width, a second electroconductive pattern disposed adjacent to the second active region and having a second width larger than the first width, a third electroconductive pattern disposed adjacent to the third active region and having a third width; and a fourth electroconductive pattern disposed adjacent to the fourth active region and having a fourth width smaller than the third width.
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H. Aikawa et al., “Variability Aware Modeling and Characterization in Standard Cell in 45 nm CMOS with Stress Enhancement Technique”, Symposium on VLSI Technology Digest of Technical Papers, 2008, pp. 90-91.
Fujita Kazushi
Mitani Junichi
Nakai Satoshi
Fujitsu Semiconductor Limited
Maldonado Julio J
Westerman Hattori Daniels & Adrian LLP
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