Semiconductor device

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means

Reexamination Certificate

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Details

C361S091100, C361S091500, C361S091600

Reexamination Certificate

active

07974056

ABSTRACT:
A semiconductor device which can achieve high breakdown voltage and high ESD tolerance of a current drive output terminal at the same time, and can quicken the response speed of a current flowing through the current drive output terminal. The inventive semiconductor device is provided, between the current drive output terminal and a first transistor or a low breakdown voltage element, with a second transistor having a breakdown voltage higher than that of the first transistor or that of the low breakdown voltage element. Furthermore, the inventive semiconductor device is provided with a diode having an anode connected with a path between the first transistor or the low breakdown voltage element and the second transistor, and a cathode connected with an ESD protection circuit.

REFERENCES:
patent: 5604655 (1997-02-01), Ito
patent: 6218881 (2001-04-01), Hiraga
patent: 7064942 (2006-06-01), Ker et al.
patent: 2004/0233595 (2004-11-01), Ker et al.
patent: 2005/0099744 (2005-05-01), Kitagawa
patent: 2005/0237681 (2005-10-01), Chen
patent: 1-110782 (1989-04-01), None
patent: 2006-278526 (2006-10-01), None
patent: 2006-332482 (2006-12-01), None
patent: 2007-336262 (2007-12-01), None
patent: WO 2008/050779 (2008-05-01), None

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