Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2011-07-05
2011-07-05
Salce, Patrick (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C361S091100, C361S091500, C361S091600
Reexamination Certificate
active
07974056
ABSTRACT:
A semiconductor device which can achieve high breakdown voltage and high ESD tolerance of a current drive output terminal at the same time, and can quicken the response speed of a current flowing through the current drive output terminal. The inventive semiconductor device is provided, between the current drive output terminal and a first transistor or a low breakdown voltage element, with a second transistor having a breakdown voltage higher than that of the first transistor or that of the low breakdown voltage element. Furthermore, the inventive semiconductor device is provided with a diode having an anode connected with a path between the first transistor or the low breakdown voltage element and the second transistor, and a cathode connected with an ESD protection circuit.
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Panasonic Corporation
Salce Patrick
Steptoe & Johnson LLP
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