Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads
Reexamination Certificate
2011-05-17
2011-05-17
Pham, Hoai v (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Bump leads
C267S251000, C267S251000, C267S251000
Reexamination Certificate
active
07944052
ABSTRACT:
A semiconductor device includes a semiconductor chip, an electrode pad provided in the semiconductor chip, in which the electrode pad includes Al as a major constituent and further includes Cu, a coupling member coupled to the electrode pad, in which the coupling member primarily includes Cu, a plurality of layers of Cu and Al alloys formed between the electrode pad and the coupling member, and an encapsulating resin that includes a halogen of less than or equal to 1000 ppm, in which the encapsulating resin encapsulates the semiconductor chip, the electrode pad, and the coupling member. The plurality of layers of Cu and Al alloys includes a CuAl2layer formed on the electrode pad, a CuAl layer formed on the CuAl2layer, and a layer including one of Cu9Al4and Cu3Al2formed on the CuAl layer.
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Chinese Office Action dated Jun. 26, 2009 (with English translation).
Okabe Seiji
Takahashi Kouhei
Tanaka Takekazu
McGinn IP Law Group PLLC
Pham Hoai v
Renesas Electronics Corporation
Ullah Elias
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