Semiconductor device

Details Semiconductor device Semiconductor device

1993-03-25

1995-04-04

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 211, G01R 3128

Patent

active

054040990

ABSTRACT:
A semiconductor device comprises a plurality of circuits formed on an IC chip area, having electric power systems each being independent, a plurality of power potential supply wires connected to the plurality of circuits, respectively, a plurality of power potential supply terminals connected to the plurality of power potential supply wires, respectively, at least one pad for voltage stress test formed on the IC chip area, and controllers for controlling a predetermined voltage stress to be applied from one of the plurality of power potential supply terminals to all power potential supply wires on the IC chip area by use of an input from the pad for voltage stress test.

REFERENCES:
patent: 4818981 (1989-04-01), Oki et al.
patent: 4970454 (1990-11-01), Stambaugh et al.
patent: 5012185 (1991-04-01), Ohfuji
patent: 5097206 (1992-03-01), Perner

Affiliated with

Also associated with

Rating

Semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2382435