Active solid-state devices (e.g. – transistors – solid-state diode – Point contact device
Reexamination Certificate
2010-09-14
2011-12-27
Dang, Trung Q (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Point contact device
C257S774000, C257S776000, C257SE45002
Reexamination Certificate
active
08084768
ABSTRACT:
A programmable semiconductor device has a switch element in an interconnection layer, wherein in at least one of the inside of a via, interconnecting a wire of a first interconnection layer and a wire of a second interconnection layer, a contact part of the via with the wire of the first interconnection layer and a contact part of the via with the wire of the second interconnection layer, there is provided a variable electrical conductivity member, such as a member of an electrolyte material. The via is used as a variable electrical conductivity type switch element or as a variable resistance device having a contact part with the wire of the first interconnection layer as a first terminal and having a contact part with the wire of the second interconnection layer as a second terminal.
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Japanese Patent Office issued a Japanese Office Action dated Mar. 9, 2009, Application No. 2004-199662.
Kaeriyama Shunichi
Mizuno Masayuki
Dang Trung Q
NEC Corporation
Young & Thompson
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