Semiconductor device

Pulse or digital communications – Spread spectrum – Direct sequence

Reexamination Certificate

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C375S219000

Reexamination Certificate

active

07835422

ABSTRACT:
In a semiconductor device having a large-scale arithmetic circuit, when there is delay in clock signals, a malfunction occurs in a circuit. In particular, in an environment where supply voltage varies as in a wireless chip, it is very difficult to precisely estimate delays in clock signals in designing. Further, in order to keep supply voltage stable, a large-scale power supply circuit is required, which increases the area of a chip, and the cost thereof. A semiconductor device provided with a power control circuit and a clock generation circuit is used to detect variation in supply voltage using the power control circuit and changing frequency and duty ratio of a clock circuit using the clock generation circuit, thereby operating an arithmetic circuit stably. A high performance semiconductor device provided with such a large-scale arithmetic circuit can be provided at low cost.

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patent: 6992468 (2006-01-01), Kranz
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patent: 2002/0093362 (2002-07-01), Matsumoto
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patent: 2005/0122819 (2005-06-01), Park et al.
patent: 2006/0061232 (2006-03-01), Min et al.
patent: 1443393 (2003-09-01), None
patent: 2000-149194 (2000-05-01), None
Hiroki Dembo et al., RFCPUs on Glass and Plastic Substrates Fabricated by TFT Transfer Technology, 2005 IEDW, 2005, pp. 1067-1069.
RFCPUs on Glass and Plastic Substrates Fabricated by TFT Transfer Technology, 2005 IEDM [5.8], 3 pages.
Office Action (Application No. 200610110005.5) Dated Jun. 19, 2009.

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