Static information storage and retrieval – Powering
Reexamination Certificate
2008-06-11
2010-12-07
Phung, Anh (Department: 2824)
Static information storage and retrieval
Powering
C365S194000
Reexamination Certificate
active
07848169
ABSTRACT:
A semiconductor device includes first and second memory circuits that are disposed in different power source blocks and operate in synchronization with a clock, first and second delay circuits that are connected between output terminals of one memory circuits and input terminals of the other memory circuits, and a determination circuit that determines whether it is a situation that can cause malfunction based on an input signal and an output signal in the memory circuits and outputs a determination result as an error detection signal. To the first and second memory circuits, different initial values are given, and it is monitored whether a signal is sent and received between the memory circuits in a toggle state or not. Thus, occurrence of a situation that can cause malfunction can be simply and quickly detected.
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Arent & Fox LLP
Fujitsu Semiconductor Limited
Phung Anh
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