Semiconductor device

Static information storage and retrieval – Powering

Reexamination Certificate

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C365S194000

Reexamination Certificate

active

07848169

ABSTRACT:
A semiconductor device includes first and second memory circuits that are disposed in different power source blocks and operate in synchronization with a clock, first and second delay circuits that are connected between output terminals of one memory circuits and input terminals of the other memory circuits, and a determination circuit that determines whether it is a situation that can cause malfunction based on an input signal and an output signal in the memory circuits and outputs a determination result as an error detection signal. To the first and second memory circuits, different initial values are given, and it is monitored whether a signal is sent and received between the memory circuits in a toggle state or not. Thus, occurrence of a situation that can cause malfunction can be simply and quickly detected.

REFERENCES:
patent: 5917761 (1999-06-01), Tietjen et al.
patent: 6314040 (2001-11-01), Reynolds
patent: 6912139 (2005-06-01), Kernahan et al.
patent: 2002/0048335 (2002-04-01), Saeki
patent: 2005/0283630 (2005-12-01), Shikata
patent: 2002-190747 (2002-07-01), None
patent: 2006-4338 (2006-01-01), None

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