Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor
Reexamination Certificate
2008-01-28
2010-06-22
Louie, Wai-Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Regenerative type switching device
Combined with field effect transistor
C257S194000, C257S335000, C257S339000, C257S342000
Reexamination Certificate
active
07741655
ABSTRACT:
A semiconductor device includes a semiconductor substrate having a main surface and a semiconductor element having an insulated gate field effect portion formed in the semiconductor substrate. The semiconductor element includes an n−region, an n-type source region, a p-type base region, an n+region, and a gate electrode. The n−region and the n-type source region are formed in the main surface. The p-type base region is formed in the main surface adjacent to the n-type source region. The n+region is formed in the main surface adjacent to the p-type base region and opposed to the n-type source region with the p-type base region being interposed, and has an impurity concentration higher than the n−region. The n−region is formed in the main surface adjacent to the p-type base region and to the n+region.
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Hatori Kenji
Narazaki Atsushi
Louie Wai-Sing
Mitsubishi Electric Corporation
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Tang Sue
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