Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-07-17
2010-12-07
Hollington, Jermele M (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07847574
ABSTRACT:
When a stop condition is satisfied, a stop condition determination circuit (10) issues a stop instruction to an operation stop control circuit (11) to stop the operation of a functional circuit (14). A storage device (12) stores therein determination results made by the stop condition determination circuit (10) and operation conditions in the functional circuit (14). An external conveying means (13) conveys the determination results made by the stop condition determination circuit (10) to outside the semiconductor device. If these determination results are used by a peripheral device external to the semiconductor device, it is possible to prevent failures in the peripheral device and malfunctions in the system caused by faults in the semiconductor device.
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English Translation of JP 2004-340877, Dec. 2, 2004.
Kamiya Hisao
Ohtori Takashi
Yoshida Kazuhiro
Hollington Jermele M
McDermott Will & Emery LLP
Panasonic Corporation
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